Welcome to the Santala Research Group!
We use transmission electron microscopy, including aberration-corrected (S)TEM and photo-emission TEM, and other characterization techniques to study:
The objective of this project, entitled “Atomic-level structural characterization of metal/γ-alumina interfaces combining theory and experiments,” is to create excellent overlap between the experimental structural characterization of metal/γ-alumina interfaces and density functional theory (DFT) based calculations, and to connect the structural information to the thermodynamic properties in the interface, including the interfacial free energy. This work is in collaboration with Dr. Líney Árnadóttír. Ion implantation followed by thermal annealing is used to produce well-defined, model metal/γ-alumina interfaces with catalytically important metal species enabling atomic resolution imaging of both phases simultaneously. The project utilizes aberration-corrected TEM and scanning TEM (STEM) to produce high quality quantitative structural data regarding the relative position of all chemical species (Al, O, and the metal) that can be meaningfully compared to DFT-based calculations of the structure and thermodynamic stability ranges of interfaces with different γ-alumina chemical terminations.
This work has been supported by the National Science Foundation under Grant No. 1610507. Any stated opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
Above: Platinum nanoparticles in Θ-alumina. Taken with the TEAM 0.5 at the National Center for Electron Microscopy
Crystallization kinetics of amorphous semiconductors and phase change materials
Above: False color image of amorphous Ge (purple) crystallizing after laser heating. The crystalline front progagates at approximately 10 m/s. Imaged with the Dynamic TEM at Lawrence Livermore National Laboratory.