Process Diagnostics - Analytical Tools 

OPIC maintains the following process diagnostics equipment:

Atomic Force Microscope - Veeco Innova SPM

Innova SPM
Image courtesy of Veeco, for more information check out the Veeco website. 

  • Contact Mode
  • Tapping ModeTM
  • Conductive AFM 
  • Electric Field Microscopy 
  • Nanolithography

FTIR

FTIR

  • Nicolet 6700 FTIR Spectrometer
  • In-situ FTIR Transmission and ATR
  • Smart iTR attachment for fast and easy analysis of solids and liquids 

PV Test Stand

DSC-TGA-Mass Spec

  • Six inch square AM 1.5 illuminated area

  • IV curve tracing

Real Time Quantum Efficiency Tester

Flash QE Tool

  • FlashQE from Tau Science

  • Photon to electron efficiency vs. wavelength

  • Studies surface passivation, carrier lifetime, bulk diffusion length

  • Spectrum collection in less than 2 seconds allows spacial mapping of QE

  • Time-resolved data for degredation studies

FlashQE Spectrum FlashQE Cell Map 

 

Variable Angle Spectroscopic Ellipsometer (VASE) - J.A. Woollam Co., Inc. 

To use the VASE or for additional information please contact:
Dr. Brady J. Gibbons, Assistant Professor 
Department of Mechanical, Industrial, and Manufacturing Engineering 
Tel: (541) 737-2427 
Fax: (541) 737-2600 
Email: brady.gibbons@oregonstate.edu 
http://mime.oregonstate.edu/research/gibbons/  

Variable Angle Spectroscopic Ellipsometer
J.A. Woollam Co., Inc. VASE, High Speed Monochromator System HS-190 & VASE Module Control VB-400 

  • Wavelength: 193~2500nm

  • Reflection and Transmission Ellipsometry

  • Generalized Ellipsometry

  • Reflectance (R) intensity 

  • Transmittance (T) intensity

  • Cross-polarized R/T

  • Depolarization

  • Scatterometry

  • Mueller-matrix